It is designed to meet the needs of Optics/DOE Lens developers & manufacturers by offering a full turnkey solution which performs a wide spectrum of tests onto Optics/DOE Lens. Light patterns are captured & analyzed for its characteristics by a Conoscopic Lens through a Transmissive Film to ensure that it meets the stringent requirements. It is also equipped with soft handling capabilities to eliminate any damages onto the DUT & wafer.
Input/Output Options | Wafer Cassette, JEDEC Tray, Customized Sockets |
Test Capabilities | Image Test – Field of View (FOV) – Flange Focal Length (FFL) – Transmission Test – Beam Spot Test – Beam Divergence |
Tester Sequence | Serial Test |
Vision Capabilities | 2D Barcode Inspection |
Intelligent Features | – Automated GR&R – Automated Retest – Automated Yield Monitoring – Automated Golden Unit Monitoring – Wafer Map File Integration – Automated OQC Sampling Test |