It is designed to meet the needs of Optics/DOE Lens developers & manufacturers by offering a full turnkey solution which performs a wide spectrum of tests onto Optics/DOE Lens. Light patterns are captured & analyzed for its characteristics by a Conoscopic Lens through a Transmissive Film to ensure that it meets the stringent requirements. It is also equipped with soft handling capabilities to eliminate any damages onto the DUT & wafer.
|Input/Output Options||Wafer Cassette, JEDEC Tray, Customized Sockets|
|Test Capabilities||Image Test – Field of View (FOV) – Flange Focal Length (FFL) – Transmission Test – Beam Spot Test – Beam Divergence|
|Tester Sequence||Serial Test|
|Vision Capabilities||2D Barcode Inspection|
|Intelligent Features||– Automated GR&R – Automated Retest – Automated Yield Monitoring – Automated Golden Unit Monitoring – Wafer Map File Integration – Automated OQC Sampling Test|