Optical VCSEL Wafer Test Handler

Optical VCSEL Wafer Test Handler

Pentamaster’s Optical VCSEL Wafer Test Handler is our next generation cutting edge full turnkey solution designed to test the electrical & optical characteristics of packages such as VCSEL, LED and LIDAR in wafer-level. It uses an integrating sphere to measure & test the optical power efficiency & wavelength of the laser emitted from the optical device sequentially with very short test time. It is also capable of performing Near & Far Field tests by using NIR sensitive camera with Conoscopic Lens to determine the emitting diameter, mode emission characteristics as well as the maximum emission angle of the optical device.

Product Specification:
Input/Output Option Wafer Cassette
Contact Mechanism Probe Type
Contact Type Kelvin/Non-Kelvin
Temperature Range 20°C~100°C
Test Capabilities – Light Current Voltage (LIV) Sweep Test
– Far Field Test
– Near Field Test
Tester Sequence Serial Test
Vision Capabilities – Automated Optical Inspection
– Wafer Alignment
Intelligent Features – Automated GR&R
– Automated Golden Unit Monitoring
– Automated Retest
– Automated Yield Monitoring
– Automated OQC Sampling Test
– Wafer Mapping Algorithm
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