Optical Lens & Wafer Test Handler

Optical Lens & Wafer Test Handler

It is designed to meet the needs of Optics/DOE Lens developers & manufacturers by offering a full turnkey solution which performs a wide spectrum of tests onto Optics/DOE Lens.

Light patterns are captured & analyzed for its characteristics by a Conoscopic Lens through a Transmissive Film to ensure that it meets the stringent requirements.

It is also equipped with soft handling capabilities to eliminate any damages onto the DUT & wafer.

Product Specification:
Input/Output Options Wafer Cassette, JEDEC Tray, Customized Sockets
Test Capabilities Image Test
– Field of View (FOV)
– Flange Focal Length (FFL)
– Transmission Test
– Beam Spot Test
– Beam Divergence
Tester Sequence Serial Test
Vision Capabilities 2D Barcode Inspection
Intelligent Features – Automated GR&R
– Automated Retest
– Automated  Yield Monitoring
– Automated Golden Unit Monitoring
– Wafer Map File Integration
– Automated OQC Sampling Test
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