It is designed to meet the needs of Optics/DOE Lens developers & manufacturers by offering a full turnkey solution which performs a wide spectrum of tests onto Optics/DOE Lens.
Light patterns are captured & analyzed for its characteristics by a Conoscopic Lens through a Transmissive Film to ensure that it meets the stringent requirements.
It is also equipped with soft handling capabilities to eliminate any damages onto the DUT & wafer.
|Input/Output Options||Wafer Cassette, JEDEC Tray, Customized Sockets|
|Test Capabilities||Image Test
– Field of View (FOV)
– Flange Focal Length (FFL)
– Transmission Test
– Beam Spot Test
– Beam Divergence
|Tester Sequence||Serial Test|
|Vision Capabilities||2D Barcode Inspection|
|Intelligent Features||– Automated GR&R
– Automated Retest
– Automated Yield Monitoring
– Automated Golden Unit Monitoring
– Wafer Map File Integration
– Automated OQC Sampling Test