Optical VCSEL Wafer Tester is our next generation cutting edge full turnkey solution designed to test the electrical & optical characteristics of packages such as VCSEL, LED and LIDAR in wafer-level. It uses an integrating sphere to measure & test the optical power efficiency & wavelength of the laser emitted from the optical device sequentially with very short test time. It is also capable of performing Near & Far Field tests by using NIR sensitive camera with Conoscopic Lens to determine the emitting diameter, mode emission characteristics as well as the maximum emission angle of the optical device.
Input/ Output Option | Wafer |
Sprint UPH | >3,600 (depending on package & machine configuration) |
Vision Capability | Wafer Alignment |
Test Capabilities |
Light Current-Voltage (LIV) Sweep Test Near Field Test Far Field Test |
Test Sites | Up to 3 test sites |
Wavelength Range | 800nm~1050nm |
Intelligent Features | Wafer Map File Integration, Automated Retest, Automated Yield Monitoring, Automated GR&R <10%, Partial Wafer Testing |