IQC DOE Tester is an innovative tester designed to test the imaging characteristics of DOE. Light pattern is captured and analysed for its characteristics through NIR sensitive camera and Lambertian Transmissive Diffuser to ensure it meets the stringent requirements. It is also equipped with soft handling capabilities to eliminate any damages onto the DUT.
|Input Options||Wafer Ring, Wafer Cassette, Customized Sockets|
|Output Options||Wafer Ring, JEDEC Tray, Wafer Cassette, Customized Sockets|
|Selection of Packages||Diffractive Optical Elements (DOE), Micro Lens Array (MLA)|
|Intelligent Features||Wafer Map File Integration, Automated Optical Inspection, Automated Yield Monitoring, Beam Spot Test, Automated GR&R <10%, Wafer Auto Alignment, Automated Re-test|