It is designed to perform burn-in test on certain LED products in wafer form by placing them under high humidity, high temperature and high current to test the LEDs reliability & performance. It is a user-friendly solution with built-in precision DMM for product monitoring and data acquisition capabilities.
Channel Number | >4000 per wafer unit |
Burn-in Duration | Programmable |
Electrical Parameter Measurements |
Current Source Range • 20mA~100mA / 0.2A~1.5A Current Measurement Tolerance • 0.2mA or ±1% Compliance Voltage • 24V DC Voltage Source Range • 5~24V DC Voltage Source Accuracy • 20mV or ±1% |
Programmable Temperature Control |
Temperature Measuring Range • Ambient~130°C Temperature Setting Range • 45°C~130°C Temperature Setting Resolution • 0.1°C Operation Setting Resolution • 0.1°C Operation Temperature • 20°C~30°C Operation Humidity • <85% RH, Non-Condensing |
Additional Features | • Vision Inspection Capability • Pass/ Reject status indication in wafer map • Current (IF) & Voltage (VF) monitoring for individual unit • Probe Cleaning • Golden Unit Monitoring |