Wafer Probe & Test

Wafer Probe & Test

Probing is a process whereby a testing instrument of the system transmit test signals to the tested subject via a prober and the signals are then returned from the device, is used to examine the functionality of the test subjects. Our probing test system is able to perform such test in a wafer level at high speed and quality test on consumer appliances whereby temperature sensors, humidity sensors and precision air manometer are used to tune and test the subjects for consistency.

An equipment used to test the conductivity of certain materials at wafer level by probing the wafer under controlled temperature and measuring the wafer voltage and current over time.