PM38 offers a complete turnkey solution with comprehensive features from wafer input, electrical functional test, stimulus test, 6-sided vision inspection, sorting and tape & reel for semiconductors, optical sensors and integrated circuits. It also provides the capability of component level traceability by reading the 2DBC on the packages.
Selection of Packages |
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Sprint UPH | >20,000 |
Input Options | 8”, 10”, 12” Wafer Size, De-Taper (Optional) |
Output Options | Tape & Reel (with auto reel changer), JEDEC Tray |
Test Capabilities | Electrical Functional Test, Stimulus Test (Sensitivity Test, Signal to Noise Ratio (SNR) Test, LED Wavelength & Radiant Test, Photo Diode Sensitivity Test, Light Current Voltage (LIV) Slope Test, Cross Talk & Measurement Test, Magnetic Test) |
Test Sites | Up to 8 sites |
Vision Capabilities | Top Vision Inspection, 2D Pad Measurement, 3D Measurement, Post Seal Inspection, Active Die Inspection, In-Pocket Inspection |